Luca Fasolo is a Research Fellow at the Istituto Nazionale di Ricerca Metrologica (INRiM) and holds a PhD in Metrology from Politecnico di Torino. His research focuses on superconducting quantum technologies, with expertise in the design, nanofabrication, and cryogenic-microwave characterization of Josephson Traveling-Wave Parametric Amplifiers (JTWPAs). He is actively involved in the development of quantum devices for advanced applications in metrology, sensing, and quantum imaging systems.

Title Of Talk : Wafer-Scale Variability and Post-Deposition Effects in Josephson Junctions for Superconducting Quantum Technologies